TUCSON, AZ, December 12, 2024 – 4D Technology, a subsidiary of Onto Innovation, today announced the production release of its new high-resolution 1 Megapixel (1 MP) Fizeau AccuFiz® Short Wavelength Infrared (SWIR) Interferometer. The release coincides with multiple orders received from leading U.S. defense and space companies for the new AccuFiz SWIR Short Wavelength Infrared Interferometer.
The device is designed to meet increasing customer demands for component quality and optical alignment needs in the aerospace, space and satellite communications industries, as well as infrared Earth observation applications.
The new AccuFiz SWIR Fizeau interferometer operating at 1550nm offers many advantages for optical metrology, including:
- The industry-leading 1024 x 1024 camera resolution improves spatial resolution and maintains transmitted signal integrity within tight tolerances, resulting in better image quality, reduced signal loss and increased efficiency of SWIR optical systems.
- The unique ability to accept external light sources at wavelengths across the C-band enables manufacturers to test optical components and systems at any operating wavelength between 1535nm and 1565nm.
- Time and dynamic acquisition modes for fast measurements, resistant to vibrations and disturbances
- Vibration resistance with dynamic interferometry for measurements in challenging non-isolated environments
- Compact, lightweight design simplifies test setup and allows for use in multiple configurations
- Extremely accurate measurements of concave, convex, unfocused SWIR systems and optics, spheres, windows, prisms, corner blocks and other optics
- Real-time optical system alignment and collimation feedback
Infrared optics play a vital role in the U.S. aerospace and defense industries due to their unique ability to detect and analyze thermal radiation. In space exploration, infrared optics facilitate the observation of celestial objects hidden by space dust or faint in visible light. In Earth observation satellites, they are used to monitor climate change, natural disasters, and environmental conditions by collecting thermal signatures and changes. In defense, infrared optics are used for surveillance, reconnaissance, and targeting. They are also important in free-space laser communications, providing secure, reliable, and high-speed transmission over long distances. In all these applications, it is essential to test optical components and systems at infrared operating wavelengths to understand the final optical performance, such as fiber coupling performance, system-level wavefront error, or other performance metrics. Additionally, measurements of individual components provide rapid feedback, allowing optical designs to be adjusted as they are built to optimize system-level performance.
“U.S. space and defense SWIR applications require optical systems that leverage the capabilities of today’s manufacturing and metrology technologies,” said Eric Novak, CEO and vice president of 4D Technology. “In response, we have strengthened our commitment to these application segments by offering higher resolution SWIR measurement systems that enable precise measurement of wavefront error and surface form at critical SWIR wavelengths. Receiving orders like this from industry leaders underscores the importance of investing in our systems development to meet changing customer needs.”
4D Technology has been leading the development of metrology technology for space-based optical instruments since its founding over 20 years ago. With measurement systems capable of operating not only at SWIR wavelengths, but also in the NIR wavelength range up to LWIR wavelengths around 10.6µm, the company is uniquely positioned to support the development of U.S. space and defense IR applications.
The new AccuFiz SWIR 1 MP laser interferometer continues 4D Technology’s tradition of delivering the world’s highest performing interferometers, backed by industry leading services and applications.
Introduction to 4D Technology
4D Technology, a subsidiary of Onto Innovation, is the world leader in dynamic, high-precision 3D surface measurement using dynamic laser interferometers, optical roughness gauges and vibration-insensitive portable automated optical profilometers. Our systems accurately measure surface features, roughness and defects in the harshest environments. Areas served: Precision Machined Surfaces, Optics, Astronomy, Aerospace & Defense, Space Telescopes, Optical Communications, Automotive, Online Manufacturing Metrology. For more information, please visit www.4dtechnology.com.
About Onto Innovation
Onto Innovation is a leader in process control combining a broad range of advanced technologies, including patternless wafer quality; 3D metrology covering chip features from nanometer-scale transistors to large-scale die interconnects; wafer and package macro-defect inspection; metal interconnects; factory analytics; and photolithography for advanced semiconductor packaging. Our broad range of products across the semiconductor value chain, combined with our Connected Thinking approach, gives us a unique perspective to help solve our customers’ toughest problems in productivity, device performance, quality and reliability. Onto Innovation strives to optimize our customers’ critical paths to progress by making them smarter, faster and more efficient. Onto Innovation is headquartered and manufactured in the United States and supports customers through a global sales and service organization. For more information, please visit www.ontoinnovation.com.
